WHY DO WE NEED PROBLEM BASED AND TECHNOLOGY BASED LEARNING AND TESTING? – RESULTS FROM THREE STUDIES ON THE DEVELOPMENT OF NEW TEST FORMATS IN VOCATIONAL EDUCATION AND TRAINING
S. Seeber, E. Wuttke, C. Greiwe, L. Turhan
Event: ICERI2019 This paper is indexed in IATED Digital Library. Session: Problem and Challenge Based Learning Session time: Monday, 11th of November from 15:00 to 16:45 Session type: ORAL Room: España 4 Presentation start time: 15:15