SELF-ASSESSMENT VERSUS EXPERT ASSESSMENT: TECHNOLOGY PROVIDES A NEW PERSPECTIVE ON A FAMILIAR DEBATE
C. Grobler, J. Steyn
Event: EDULEARN15 This paper is indexed in IATED Digital Library. Session: Experiences in Assessment of Student Learning Session time: Tuesday, 7th of July from 08:30 to 10:00 Session type: ORAL Room: Milá Presentation start time: 09:30